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Journal description
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Details for article 17 of 25 found articles
| Title: |
Prediction of electromigration-void formation in copper conductors based on the electron configuration of matrix and solute atoms |
| Author: |
Zehe, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 12 pages 7 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 25 found articles
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