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                                       Details for article 77 of 78 found articles
 
 
  Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS
 
 
Title: Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS
Author: Rey-Tauriac, Y.
Taurin, M.
Bonnaud, O.
Appeared in: Microelectronics reliability
Paging: Volume 41 (2001) nr. 9-10 pages 4 p.
Year: 2001
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 77 of 78 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands