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Journal description
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Details for article 69 of 78 found articles
| Title: |
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures |
| Author: |
Bychikhin, S. Litzenberger, M. Pichler, R. Pogany, D. Gornik, E. Groos, G. Stecher, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 9-10 pages 6 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 69 of 78 found articles
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