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Journal description
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Details for article 3 of 20 found articles
| Title: |
Determination of trap cross-section in a-Si:H p-i-n diodes parameters using simulation and parameter extraction |
| Author: |
Estrada, Magali Cerdeira, Antonio Ortiz-Conde, Adelmo Garcı́a, Francisco |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 4 pages 6 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 20 found articles
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