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Journal description
All volumes of the corresponding journal
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Details for article 15 of 19 found articles
| Title: |
Reliability aspects of thermal micro-structures implemented on industrial 0.8 μm CMOS chips |
| Author: |
Sheng, L.Y De Tandt, C Ranson, W Vounckx, R |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 2 pages 9 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 19 found articles
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