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Journal description
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Details for article 3 of 19 found articles
| Title: |
A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge |
| Author: |
Yan, B.P Yang, Y.F Hsu, C.C Lo, H.B Yang, E.S |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 12 pages 5 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 19 found articles
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