|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 10 of 19 found articles
| Title: |
Impact of gate oxide nitridation process on 1/f noise in 0.18 μm CMOS |
| Author: |
Da Rold, M Simoen, E Mertens, S Schaekers, M Badenes, G Decoutere, S |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 12 pages 6 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 19 found articles
| << previous | next >> |