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Journal description
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Details for article 6 of 22 found articles
| Title: |
Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle |
| Author: |
Ohyama, H. Simoen, E. Kuroda, S. Claeys, C. Takami, Y. Hakata, T. Kobayashi, K. Nakabayashi, M. Sunaga, H. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 1 pages 7 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 22 found articles
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