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                                       Details for article 64 of 87 found articles
 
 
  Reliability of flip chip and chip size packages
 
 
Title: Reliability of flip chip and chip size packages
Author: Reichl, H.
Schubert, A.
Töpper, M.
Appeared in: Microelectronics reliability
Paging: Volume 40 (2000) nr. 8-10 pages 12 p.
Year: 2000
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 64 of 87 found articles
 
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