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Journal description
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Details for article 2 of 22 found articles
| Title: |
A new method of studying on the dynamic parameters of bulk traps in thin SiO2 layer of MOS structures |
| Author: |
Bing, Xie Yandong, He Mingzhen, Xu Changhua, Tan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 40 (2000) nr. 6 pages 5 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 22 found articles
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