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Journal description
All volumes of the corresponding journal
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Details for article 7 of 80 found articles
| Title: |
A software for optical characterization of thin films for microelectronic applications |
| Author: |
Leinfellner, N Ferré-Borrull, J Bosch, S |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 40 (2000) nr. 4-5 pages 3 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 80 found articles
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