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Journal description
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Details for article 10 of 20 found articles
| Title: |
Effect of drain voltage on channel temperature and reliability of pseudomorphic InP-based HEMTs |
| Author: |
Dammann, M. Chertouk, M. Jantz, W. Köhler, K. Marsetz, W. Schmidt, K.H. Weimann, G. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 40 (2000) nr. 2 pages 5 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 20 found articles
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