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  A characteristic analysis of high-speed integrated circuit chip based on laser probe
 
 
Title: A characteristic analysis of high-speed integrated circuit chip based on laser probe
Author: Xiaojian, Tian
Maobin, Yi
Wei, Sun
Appeared in: Microelectronics reliability
Paging: Volume 40 (2000) nr. 2 pages 4 p.
Year: 2000
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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