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                                       Details for article 29 of 34 found articles
 
 
  Random telegraph noise and leakage current in smart power technology DMOS devices
 
 
Title: Random telegraph noise and leakage current in smart power technology DMOS devices
Author: Pogany, D
Gornik, E
Stecher, M
Werner, W
Appeared in: Microelectronics reliability
Paging: Volume 40 (2000) nr. 11 pages 4 p.
Year: 2000
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 29 of 34 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands