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Journal description
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Details for article 21 of 34 found articles
| Title: |
Measurements of 1/f noise amplitude modulated by a large-signal carrier in bipolar junction transistors |
| Author: |
Sanchez, Juan E. Bosman, Gijs |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 40 (2000) nr. 11 pages 7 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 34 found articles
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