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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 7 of 19 found articles
| Title: |
1/f, g–r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices |
| Author: |
Xu, Jiansheng Abbott, Derek Dai, Yisong |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 40 (2000) nr. 1 pages 8 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 19 found articles
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