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Journal description
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Details for article 10 of 19 found articles
| Title: |
Influence of chemical corrosion on resistivity and 1/f noise of polysilicon gauges |
| Author: |
Michelutti, L. Mathieu, N. Chovet, A. Galerie, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 40 (2000) nr. 1 pages 5 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 19 found articles
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