|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 12 of 85 found articles
| Title: |
A technique for measuring the temperature of nickel-chromium films in thin film circuits |
| Author: |
Parmee, J.L. Giles, D.W. Russell, R.F. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 4 (1965) nr. 3 pages 2 p. |
| Year: |
1965 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 85 found articles
| << previous | next >> |