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Journal description
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Details for article 2 of 17 found articles
| Title: |
Analysis of external latch-up protection test structure design using numerical simulation |
| Author: |
Palser, Kevin Concannon, Ann Duffy, Ray Mathewson, Alan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 5 pages 13 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 17 found articles
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