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Journal description
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Details for article 1 of 17 found articles
| Title: |
Accelerated dielectric breakdown and wear out standard testing methods and structures for reliability evaluation of thin oxides |
| Author: |
Ghibaudo, G Pananakakis, G Kies, R Vincent, E Papadas, C |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 5 pages 17 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 17 found articles
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