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Journal description
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Details for article 10 of 15 found articles
| Title: |
Process characterisation of hot-carrier-induced β degradation in bipolar transistors for BiCMOS |
| Author: |
Arshak, A. McDonagh, D. Arshak, K.I. Doyle, D. Harrow, I. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 4 pages 7 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 15 found articles
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