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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 27 found articles
| Title: |
Degradation of electron irradiated MOS capacitors |
| Author: |
Candelori, A. Paccagnella, A. Scarpa, A. Ghidini, G. Fuochi, P.G. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 2 pages 7 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 27 found articles
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