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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 3 of 27 found articles
| Title: |
Breakdown properties of metal/NIDOS SiO2/silicon structures |
| Author: |
Temple-Boyer, P Olivié, F Scheid, E Sarrabayrouse, G Alay, J.L Morante, J.R |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 2 pages 4 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 27 found articles
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