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Journal description
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Details for article 25 of 27 found articles
| Title: |
Switching events in the soft breakdown I–t characteristic of ultra-thin SiO2 layers |
| Author: |
Miranda, E Suñé, J Rodrı́guez, R Nafrı́a, M Aymerich, X |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 2 pages 4 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 27 found articles
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