Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 6 of 18 found articles
 
 
  Hot electron degradation effects in 0.14 μm AlInAs/GaInAs/InP HEMTs
 
 
Title: Hot electron degradation effects in 0.14 μm AlInAs/GaInAs/InP HEMTs
Author: Nawaz, M
Zirath, H
Choumas, E
Persson, S.H.M
Jasik, A
Strupinski, W
Appeared in: Microelectronics reliability
Paging: Volume 39 (1999) nr. 12 pages 7 p.
Year: 1999
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 18 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands