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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 18 found articles
| Title: |
Hot electron degradation effects in 0.14 μm AlInAs/GaInAs/InP HEMTs |
| Author: |
Nawaz, M Zirath, H Choumas, E Persson, S.H.M Jasik, A Strupinski, W |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 12 pages 7 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 18 found articles
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