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Journal description
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Details for article 2 of 18 found articles
| Title: |
DC and pulsed measurements of on-state breakdown voltage in GaAs MESFETs and InP-based HEMTs |
| Author: |
Meneghesso, Gaudenzio Massari, Giovanni Buttari, Dario Bortoletto, Andrea Maretto, Massimo Zanoni, Enrico |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 12 pages 5 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 18 found articles
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