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Journal description
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Details for article 8 of 37 found articles
| Title: |
Design and analysis of a self-testing-and-repairing random access memory “STAR–RAM” with error correction |
| Author: |
A. Mehdi, Kamal M. Kontoleon, J. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 4 pages 13 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 37 found articles
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