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Journal description
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Details for article 15 of 37 found articles
| Title: |
HOT-CARRIER RELIABILITY IN n-MOSFETs USED AS PASS-TRANSISTORS |
| Author: |
Goguenheim, D Bravaix, A Vuillaume, D Varrot, M Revil, N Mortini, P |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 4 pages 6 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elseiver Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 37 found articles
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