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Journal description
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Details for article 5 of 21 found articles
| Title: |
Effect of N2O nitridation on the electrical properties of MOS gate oxides |
| Author: |
Pacelli, A Lacaita, A.L Spinelli, A Bez, R |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 2 pages 4 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 21 found articles
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