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Journal description
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Details for article 14 of 21 found articles
| Title: |
Observation of high interface state densities at the silicon/oxide interface for low doped polysilicon/oxide/silicon capacitor structures |
| Author: |
Leveugle, C Hurley, P.K Mathewson, A Moran, S Sheehan, E Kalnitsky, A |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 2 pages 5 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 21 found articles
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