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Journal description
All volumes of the corresponding journal
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Details for article 8 of 18 found articles
| Title: |
Off-state gate current with quasi-zero temperature coefficient in n-MOSFETs with reoxidized nitrided oxide as gate dielectric |
| Author: |
Lai, P.T Xu, Jing-Ping Lo, H.B Cheng, Y.C |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 10 pages 5 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 18 found articles
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