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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 18 found articles
| Title: |
Building in reliability with latch-up, ESD and hot carrier effects on 0.25 μm CMOS technology |
| Author: |
Leroux, C Salome, P Reimbold, G Blachier, D Guegan, G Bonis, M |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 10 pages 6 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 18 found articles
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