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Journal description
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Details for article 25 of 78 found articles
| Title: |
Efficient output ESD protection for 0.5-μm high-speed CMOS SRAM IC with well-coupled technique |
| Author: |
Ker, Ming-Dou Wu, Chau-Neng |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 36 (1996) nr. 11-12 pages 1731-1734 |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 78 found articles
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