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Journal description
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Details for article 19 of 78 found articles
| Title: |
Copper interconnection lines: SARF characterization and lifetime test |
| Author: |
Ciofi, C. Dattilo, V. Neri, B. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 36 (1996) nr. 11-12 pages 1747-1750 |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 78 found articles
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