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Journal description
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Details for article 4 of 19 found articles
| Title: |
Bayesian prediction for the range with a burr distribution and a random sample size |
| Author: |
Ashour, S.K. El-Wakeel, M.A.M.H. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 34 (1994) nr. 6 pages 5 p. |
| Year: |
1994 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 19 found articles
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