|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 7 of 22 found articles
| Title: |
Discontinuities in homogeneous markov processes and their use in modelling technical systems under inspection |
| Author: |
Becker, G. Camarinopoulos, L. Ohlmeyer, W. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 34 (1994) nr. 5 pages 18 p. |
| Year: |
1994 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 22 found articles
| << previous | next >> |