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Journal description
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Details for article 6 of 12 found articles
| Title: |
Influence of the testing environment in bipolar transistors radiation resistance results: A benchmark exercise |
| Author: |
Decréton, M. Benemann, A. Sharp, R. Coenen, S. Van Beckhoven, D. Podgorski, J. Pater, L. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 33 (1993) nr. 14 pages 11 p. |
| Year: |
1993 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 12 found articles
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