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                                       Details for article 16 of 20 found articles
 
 
  Reliability issues of silicon-dioxide structures—Application to FLOTOX EEPROM cells
 
 
Title: Reliability issues of silicon-dioxide structures—Application to FLOTOX EEPROM cells
Author: Papadas, C.
Ghibaudo, G.
Monserié, C.
Pananakakis, G.
Appeared in: Microelectronics reliability
Paging: Volume 33 (1993) nr. 11-12 pages 42 p.
Year: 1993
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 20 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands