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Journal description
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Details for article 11 of 20 found articles
| Title: |
Reliability assessment of CCDs operating under ionizing radiation ambients: Failure — Simulation studies via electrical overstressing |
| Author: |
Agbo, Samuel O. Neelakanta, Perambur S. Lay, Lourdes M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 32 (1992) nr. 7 pages 14 p. |
| Year: |
1992 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 20 found articles
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