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Journal description
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Details for article 135 of 141 found articles
| Title: |
Transient solutions of a software reliability model with imperfect debugging and error generation |
| Author: |
Kapur, P.K. Sharma, K.D. Garg, R.B. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 32 (1992) nr. 4 pages 4 p. |
| Year: |
1992 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 135 of 141 found articles
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