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                                       Details for article 19 of 25 found articles
 
 
  Reliability problems of submicron MOS transistors and circuits
 
 
Title: Reliability problems of submicron MOS transistors and circuits
Author: Krautschneider, Wolfgang H.
Terletzki, Hartmud
Wang, Qin
Appeared in: Microelectronics reliability
Paging: Volume 32 (1992) nr. 11 pages 10 p.
Year: 1992
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 19 of 25 found articles
 
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