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Journal description
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Details for article 49 of 87 found articles
| Title: |
Monte Carlo simulation for improving electromigration lifetime by balancing temperature and structural gradients |
| Author: |
Gui, X. Wang, M.Z. Gao, G.B. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 31 (1991) nr. 2-3 pages 12 p. |
| Year: |
1991 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 49 of 87 found articles
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