|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 23 of 87 found articles
| Title: |
4932028 Error log system for self-testing in very large scale integrated circuit (VLSI) units |
| Author: |
Katircioglu, Haluk De Beule, JohnA Mukherjee, Debaditya Whitlock, GaryC |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 31 (1991) nr. 2-3 pages 1 p. |
| Year: |
1991 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 23 of 87 found articles
| << previous | next >> |