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Journal description
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Details for article 96 of 157 found articles
| Title: |
Optimal low-frequency noise criteria used as a reliability test for BJTs and experimental results |
| Author: |
Dai, Yisong |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 31 (1991) nr. 1 pages 4 p. |
| Year: |
1991 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 96 of 157 found articles
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