|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 105 of 144 found articles
| Title: |
4825439 Semiconductor logic integrated circuit device having first and second operation modes for testing |
| Author: |
Sakashita, Kazuhio Kishida, Satoru Hanibuchi, Toshiak |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 29 (1989) nr. 6 pages 1 p. |
| Year: |
1989 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 105 of 144 found articles
| << previous | next >> |