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Journal description
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Details for article 64 of 168 found articles
| Title: |
Effect of metal line geometry on electromigration lifetime in Al-Cu submicron interconnects |
| Author: | |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 29 (1989) nr. 5 pages 1 p. |
| Year: |
1989 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 64 of 168 found articles
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