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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 57 of 60 found articles
| Title: |
4750890 Test socket for an integrated circuit package |
| Author: |
Dube, Milford Kuhn, PeterE Yorgensen, HarryP |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 29 (1989) nr. 2 pages 1 p. |
| Year: |
1989 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 57 of 60 found articles
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