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Journal description
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Details for article 5 of 31 found articles
| Title: |
A study of a 2-unit system with ‘random breakdown’ of the repair facility |
| Author: |
Shankar Bhat, K. Gururajan, M. Nayak, Panduranga |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 28 (1988) nr. 3 pages 3 p. |
| Year: |
1988 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 31 found articles
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