|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 19 of 50 found articles
| Title: |
4517512 Integrated circuit test apparatus test head |
| Author: |
Petrich, DennisM Amick, Christopher Gruenenwald, StanleyL |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 26 (1986) nr. 2 pages 1 p. |
| Year: |
1986 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 50 found articles
| << previous | next >> |