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Journal description
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Details for article 7 of 44 found articles
| Title: |
Availability analysis of a two-unit (dissimilar) parallel system with inspection and bivariate exponential life times |
| Author: |
Goel, L.R. Gupta, Rakesh Singh, S.K. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 25 (1985) nr. 1 pages 4 p. |
| Year: |
1985 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 44 found articles
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